章節

• Chapter1: Introduction
  • ● 1-1 What, Why and How?
  • ● 1-2 History and Developments of TEM
  • ● 1-3 Limitations of TEM analysis
• Chapter2: The Structure and Resolution
  • ● 2-1-1 The Structure of TEM
  • ● 2-1-2 The Structure of TEM
  • ● 2-2 Aberration and Resolution
• Chapter3: Elastic Scattering of Electrons
  • ● 3-1 Scattering of Electrons
  • ● 3-2 Scattering from Isolated Atom
  • ● 3-3 Scattering from a Crystal
  • ● 3-4 Selection Rule
• Chapter4: Diffraction
  • ● 4-1 Reciprocal Space
  • ● 4-2 The Ewald Sphere
  • ● 4-3 The Thin-Foil Effect on Diffraction Spots
• Chapter5: Imaging
  • ● 5-1 Amplitude-Contrast Images
  • ● 5-2 Phase-Contrast Images
  • ● 5-3 Thickness and Bending Effects
  • ● 5-4 Imaging Planar Defects
• Chapter6: Scanning Transmission Electron Microscopy
  • ● 6-1 Principles of STEM
  • ● 6-2 Cs-Corrector
  • ● 6-3 Ronchigram
  • ● 6-4 Image Modes in STEM

講師

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國立清華大學 教授 ｜ 查看講師

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